Two-step carrier-wave stitching method for aspheric and freeform surface measurement with a standard spherical interferometer

Qun Hao, Shaopu Wang, Yao Hu*, Yifeng Tan, Tengfei Li, Shanshan Wang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Two-step carrier-wave stitching method for aspheric and freeform surface measurement with a standard spherical interferometer'. Together they form a unique fingerprint.

Engineering

Earth and Planetary Sciences

Physics