High-Temperature Storage Deterioration Mechanism of Cylindrical 21700-Type Batteries Using Ni-Rich Cathodes under Different SOCs

Daozhong Hu, Qiyu Zhang, Jun Tian, Lai Chen*, Ning Li, Yuefeng Su*, Liying Bao, Yun Lu, Duanyun Cao, Kang Yan, Shi Chen, Feng Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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