TY - GEN
T1 - Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing
AU - Li, Xin
AU - Jiang, Lan
AU - Wang, Cong
AU - Tsai, Hai Lung
PY - 2012
Y1 - 2012
N2 - A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.
AB - A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.
UR - http://www.scopus.com/inward/record.url?scp=84455193229&partnerID=8YFLogxK
U2 - 10.1557/opl.2011.1220
DO - 10.1557/opl.2011.1220
M3 - Conference contribution
AN - SCOPUS:84455193229
SN - 9781605113425
T3 - Materials Research Society Symposium Proceedings
SP - 3
EP - 8
BT - Laser-Material Interactions at Micro/Nanoscales
T2 - 2011 MRS Spring Meeting
Y2 - 25 April 2011 through 29 April 2011
ER -