Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing

Xin Li; Lan Jiang; Cong Wang; Hai Lung Tsai

doi:10.1557/opl.2011.1220

Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing

Xin Li, Lan Jiang^*, Cong Wang, Hai Lung Tsai

^*Corresponding author for this work

School of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Citations (Scopus)

Abstract

A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.

Original language	English
Title of host publication	Laser-Material Interactions at Micro/Nanoscales
Pages	3-8
Number of pages	6
DOIs	https://doi.org/10.1557/opl.2011.1220
Publication status	Published - 2012
Event	2011 MRS Spring Meeting - San Francisco, CA, United States Duration: 25 Apr 2011 → 29 Apr 2011

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1365
ISSN (Print)	0272-9172

Conference

Conference	2011 MRS Spring Meeting
Country/Territory	United States
City	San Francisco, CA
Period	25/04/11 → 29/04/11

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10.1557/opl.2011.1220

Cite this

@inproceedings{7ebafc218ba547da83ea2f9ec404fe0c,

title = "Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing",

abstract = "A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.",

author = "Xin Li and Lan Jiang and Cong Wang and Tsai, {Hai Lung}",

year = "2012",

doi = "10.1557/opl.2011.1220",

language = "English",

isbn = "9781605113425",

series = "Materials Research Society Symposium Proceedings",

pages = "3--8",

booktitle = "Laser-Material Interactions at Micro/Nanoscales",

note = "2011 MRS Spring Meeting ; Conference date: 25-04-2011 Through 29-04-2011",

}

Li, X , Jiang, L, Wang, C & Tsai, HL 2012, Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing. in Laser-Material Interactions at Micro/Nanoscales. Materials Research Society Symposium Proceedings, vol. 1365, pp. 3-8, 2011 MRS Spring Meeting, San Francisco, CA, United States, 25/04/11. https://doi.org/10.1557/opl.2011.1220

Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing. / Li, Xin ; Jiang, Lan; Wang, Cong et al.
Laser-Material Interactions at Micro/Nanoscales. 2012. p. 3-8 (Materials Research Society Symposium Proceedings; Vol. 1365).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing

AU - Li, Xin

AU - Jiang, Lan

AU - Wang, Cong

AU - Tsai, Hai Lung

PY - 2012

Y1 - 2012

N2 - A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.

AB - A femtosecond (fs) pulse duration is shorter than many physical/chemical characteristic times, such as the electron-photon relaxation time, which makes it possible to control electron dynamics. This paper reviews our recent progress which proposes to change electron dynamics (selective excitation/ionization) and electron densities/temperatures in materials to control the following properties and processes: 1) the transient (femtosecond-to-picosecond time scale), localized (nanometer-to-micrometer length scale) material properties, 2) the corresponding photon absorption process, and 3) phase change mechanisms, by manipulating fs pulse-train number/delay for high-precision micro/nanoscale manufacturing.

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U2 - 10.1557/opl.2011.1220

DO - 10.1557/opl.2011.1220

M3 - Conference contribution

AN - SCOPUS:84455193229

SN - 9781605113425

T3 - Materials Research Society Symposium Proceedings

SP - 3

EP - 8

BT - Laser-Material Interactions at Micro/Nanoscales

T2 - 2011 MRS Spring Meeting

Y2 - 25 April 2011 through 29 April 2011

ER -

Transient localized material properties changes by ultrafast laser-pulse manipulation of electron dynamics in micro/nano manufacturing

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