An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

C. L. Heng; J. T. Li; Z. Han; P. G. Yin

doi:10.1080/10584587.2014.901125

An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO ₂ thin film

C. L. Heng^*, J. T. Li, Z. Han, P. G. Yin

^*此作品的通讯作者

物理学院

科研成果: 期刊稿件 › 文章 › 同行评审

2 引用（Scopus）

摘要

We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO₂ thin film. The Eu (both Eu²⁺ and Eu³⁺) PL and the Yb³⁺ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu²⁺-related silicates (EuSiO₃) have formed in the oxide as well as the formation of Yb₂Si ₂O₇.

源语言	英语
页（从-至）	179-186
页数	8
期刊	Integrated Ferroelectrics
卷	151
期	1
DOI	https://doi.org/10.1080/10584587.2014.901125
出版状态	已出版 - 12 2月 2014

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title = "An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film",

abstract = "We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.",

keywords = "Rare earth co-doping, down-conversion luminescence, silicates",

author = "Heng, {C. L.} and Li, {J. T.} and Z. Han and Yin, {P. G.}",

year = "2014",

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doi = "10.1080/10584587.2014.901125",

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T1 - An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

AU - Heng, C. L.

AU - Li, J. T.

AU - Han, Z.

AU - Yin, P. G.

PY - 2014/2/12

Y1 - 2014/2/12

N2 - We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.

AB - We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.

KW - Rare earth co-doping

KW - down-conversion luminescence

KW - silicates

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DO - 10.1080/10584587.2014.901125

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SN - 1058-4587

VL - 151

SP - 179

EP - 186

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1

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An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

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An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO ₂ thin film