An abnormal photoluminescence enhancement in (Eu, Yb) Co-doped SiO 2 thin film

C. L. Heng*, J. T. Li, Z. Han, P. G. Yin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si 2O7.

Original languageEnglish
Pages (from-to)179-186
Number of pages8
JournalIntegrated Ferroelectrics
Volume151
Issue number1
DOIs
Publication statusPublished - 12 Feb 2014

Keywords

  • Rare earth co-doping
  • down-conversion luminescence
  • silicates

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