The photoluminescence and structural properties of (Ce, Yb) co-doped silicon oxides after high temperature annealing

C. L. Heng*, J. T. Li, W. Y. Su, P. G. Yin, T. G. Finstad

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

We studied the photoluminescence (PL) and structural properties of Ce and Yb co-doped silicon oxide films after high temperature annealing. The PL spectra of Ce3+ and Yb3+ ions were sensitive to the structural variation of the films, and the Yb PL intensities were significantly enhanced especially upon 1200 °C annealing. X-ray diffraction, transmission electron microscopy, and X-ray photoelectron spectroscopy, indicated that rare earth silicates and the CeO2 phase had formed in the oxides. The proportions of the phases varied with the "nominal Si-richness" of the films. Energy transfer from the excited Ce3+ to Yb3+ can be inferred from both PL excitation and decay spectra.

Original languageEnglish
Article number043101
JournalJournal of Applied Physics
Volume117
Issue number4
DOIs
Publication statusPublished - 28 Jan 2015

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