The artificial periodic lattice phase analysis method applied to deformation evaluation of TiNi shape memory alloy in micro scale

Z. W. Liu*, X. F. Huang, H. M. Xie, X. H. Lou, H. Du

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

The basic principle of the artificial periodic lattice phase analysis method on the basis of an artificial periodic lattice was thoroughly introduced in this investigation. The improved technique is intended to expand from nanoscale to micro- and macroscopic realms on the test field of experimental mechanics in combination with a submicron grid, which is produced by a focused ion beam (FIB). Phase information can be obtained from the filtered images after fast Fourier transform (FFT) and inverse FFT. Thus, the in-plane displacement fields as well as the local strain distributions related to the phase information will be evaluated. The application scope of the technique was obtained by the simulation experiment. The displacement fields as well as strain distributions of porous TiNi shape memory alloy were calculated by the technique after compressive loading in micro scale. The specimen grid was directly fabricated on the tested flat surface by employing a FIB. The evolution rule of shear zones in micro area near porous has been discovered. The obtained results indicate that the technique not only could be well applied to measuring full field deformation, but also, more significantly, is available to present mechanical properties in micro scale.

Original languageEnglish
Article number125702
JournalMeasurement Science and Technology
Volume22
Issue number12
DOIs
Publication statusPublished - Dec 2011

Keywords

  • APLPA
  • Fourier transform
  • grating
  • shape memory alloy

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