摘要
The basic principle of the artificial periodic lattice phase analysis method on the basis of an artificial periodic lattice was thoroughly introduced in this investigation. The improved technique is intended to expand from nanoscale to micro- and macroscopic realms on the test field of experimental mechanics in combination with a submicron grid, which is produced by a focused ion beam (FIB). Phase information can be obtained from the filtered images after fast Fourier transform (FFT) and inverse FFT. Thus, the in-plane displacement fields as well as the local strain distributions related to the phase information will be evaluated. The application scope of the technique was obtained by the simulation experiment. The displacement fields as well as strain distributions of porous TiNi shape memory alloy were calculated by the technique after compressive loading in micro scale. The specimen grid was directly fabricated on the tested flat surface by employing a FIB. The evolution rule of shear zones in micro area near porous has been discovered. The obtained results indicate that the technique not only could be well applied to measuring full field deformation, but also, more significantly, is available to present mechanical properties in micro scale.
源语言 | 英语 |
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文章编号 | 125702 |
期刊 | Measurement Science and Technology |
卷 | 22 |
期 | 12 |
DOI | |
出版状态 | 已出版 - 12月 2011 |