Fiducial marker detection via deep learning approach for electron tomography

Yu Hao, Renmin Han, Xiaohua Wan, Fa Zhang*, Shiwei Sun

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Marker-based alignment widely used for tilt series alignment in electron tomography (ET) is crucial to high-resolution tomographic reconstruction. However, accurate alignment with markers remains a challenge because it is difficult to detect markers accurately and obtain the precise positions of fiducial markers in the tilt series. Conventional marker detection algorithms highly depending on marker template and threshold for classification lack the adaptation for different types of samples. The classification accuracy is severely affected by high contrast structures other than markers and high-density areas. In this paper, we present an automatic fiducial marker detection algorithm that applies a fine-tuned classification model to fit with the particular dataset. The classification via a convolutional neural network (CNN) for marker detection is solved as a binary classification problem distinguishing between the positive samples and negative samples. Also, we established the training data for the model to learn the patterns of the fiducial marker and background noise. The experimental results indicate that our deep learning based marker detection algorithm can identify sufficient fiducial markers with high accuracy in a fully automatic manner and shows superiority compared with previous work.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018
EditorsHarald Schmidt, David Griol, Haiying Wang, Jan Baumbach, Huiru Zheng, Zoraida Callejas, Xiaohua Hu, Julie Dickerson, Le Zhang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages642-645
Number of pages4
ISBN (Electronic)9781538654880
DOIs
Publication statusPublished - 21 Jan 2019
Externally publishedYes
Event2018 IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018 - Madrid, Spain
Duration: 3 Dec 20186 Dec 2018

Publication series

NameProceedings - 2018 IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018

Conference

Conference2018 IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018
Country/TerritorySpain
CityMadrid
Period3/12/186/12/18

Keywords

  • convolutional neural networks
  • deep learning
  • electron tomography
  • fiducial marker detection

Fingerprint

Dive into the research topics of 'Fiducial marker detection via deep learning approach for electron tomography'. Together they form a unique fingerprint.

Cite this