Experiment study on nanometer moire method with scanning tunneling microscope

Hui Min Xie; Zhan Wei Liu; Hai Xia Shang; Hai Ming Guo; Dai Ning Fang; Fu Long Dai; Hong Jun Gao

Experiment study on nanometer moire method with scanning tunneling microscope

Hui Min Xie^*, Zhan Wei Liu, Hai Xia Shang, Hai Ming Guo, Dai Ning Fang, Fu Long Dai, Hong Jun Gao

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A new scanning tunneling microscope (STM) nano-moire method for measuring nanometer-deformation is proposed. In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating. The principle of forming STM nano-moire and experimental techniques is described in detail. Nano-deformation virtual strain of high orientated pyrolytic graphite (HOPG) is measured by using of this method, virtual direct strain values gained according to the change from scanning size is compared with the theoretic solution.

Original language	English
Pages (from-to)	179-182
Number of pages	4
Journal	Guangxue Jishu/Optical Technique
Volume	29
Issue number	2
Publication status	Published - Mar 2003
Externally published	Yes

Keywords

Crystal lattice
Nano-metrology
Nano-moire
Scanning tunneling microscope

Cite this

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title = "Experiment study on nanometer moire method with scanning tunneling microscope",

abstract = "A new scanning tunneling microscope (STM) nano-moire method for measuring nanometer-deformation is proposed. In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating. The principle of forming STM nano-moire and experimental techniques is described in detail. Nano-deformation virtual strain of high orientated pyrolytic graphite (HOPG) is measured by using of this method, virtual direct strain values gained according to the change from scanning size is compared with the theoretic solution.",

keywords = "Crystal lattice, Nano-metrology, Nano-moire, Scanning tunneling microscope",

author = "Xie, {Hui Min} and Liu, {Zhan Wei} and Shang, {Hai Xia} and Guo, {Hai Ming} and Fang, {Dai Ning} and Dai, {Fu Long} and Gao, {Hong Jun}",

year = "2003",

month = mar,

language = "English",

volume = "29",

pages = "179--182",

journal = "Guangxue Jishu/Optical Technique",

issn = "1002-1582",

publisher = "Optical Technique",

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T1 - Experiment study on nanometer moire method with scanning tunneling microscope

AU - Xie, Hui Min

AU - Liu, Zhan Wei

AU - Shang, Hai Xia

AU - Guo, Hai Ming

AU - Fang, Dai Ning

AU - Dai, Fu Long

AU - Gao, Hong Jun

PY - 2003/3

Y1 - 2003/3

N2 - A new scanning tunneling microscope (STM) nano-moire method for measuring nanometer-deformation is proposed. In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating. The principle of forming STM nano-moire and experimental techniques is described in detail. Nano-deformation virtual strain of high orientated pyrolytic graphite (HOPG) is measured by using of this method, virtual direct strain values gained according to the change from scanning size is compared with the theoretic solution.

AB - A new scanning tunneling microscope (STM) nano-moire method for measuring nanometer-deformation is proposed. In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating. The principle of forming STM nano-moire and experimental techniques is described in detail. Nano-deformation virtual strain of high orientated pyrolytic graphite (HOPG) is measured by using of this method, virtual direct strain values gained according to the change from scanning size is compared with the theoretic solution.

KW - Crystal lattice

KW - Nano-metrology

KW - Nano-moire

KW - Scanning tunneling microscope

UR - http://www.scopus.com/inward/record.url?scp=0038389753&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0038389753

SN - 1002-1582

VL - 29

SP - 179

EP - 182

JO - Guangxue Jishu/Optical Technique

JF - Guangxue Jishu/Optical Technique

IS - 2

ER -

Experiment study on nanometer moire method with scanning tunneling microscope

Abstract

Keywords

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