Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Lei Qian; Wei Liu; Bera Debasis; Feng Teng; Sheng Yi Yang; Yan Bing Hou; Xu Rong Xu

doi:10.1016/j.physb.2007.09.095

Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Lei Qian^*, Wei Liu, Bera Debasis, Feng Teng, Sheng Yi Yang, Yan Bing Hou, Xu Rong Xu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

Original language	English
Pages (from-to)	1719-1722
Number of pages	4
Journal	Physica B: Condensed Matter
Volume	403
Issue number	10-11
DOIs	https://doi.org/10.1016/j.physb.2007.09.095
Publication status	Published - 1 May 2008
Externally published	Yes

Keywords

Disassociation
Franz-Keldysh model
MEH-PPV exciton

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10.1016/j.physb.2007.09.095

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title = "Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure",

abstract = "By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.",

keywords = "Disassociation, Franz-Keldysh model, MEH-PPV exciton",

author = "Lei Qian and Wei Liu and Bera Debasis and Feng Teng and Yang, {Sheng Yi} and Hou, {Yan Bing} and Xu, {Xu Rong}",

year = "2008",

month = may,

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doi = "10.1016/j.physb.2007.09.095",

language = "English",

volume = "403",

pages = "1719--1722",

journal = "Physica B: Condensed Matter",

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T1 - Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

AU - Qian, Lei

AU - Liu, Wei

AU - Debasis, Bera

AU - Teng, Feng

AU - Yang, Sheng Yi

AU - Hou, Yan Bing

AU - Xu, Xu Rong

PY - 2008/5/1

Y1 - 2008/5/1

N2 - By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

AB - By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

KW - Disassociation

KW - Franz-Keldysh model

KW - MEH-PPV exciton

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DO - 10.1016/j.physb.2007.09.095

M3 - Article

AN - SCOPUS:40949143664

SN - 0921-4526

VL - 403

SP - 1719

EP - 1722

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 10-11

ER -

Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Abstract

Keywords

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