Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Lei Qian; Wei Liu; Bera Debasis; Feng Teng; Sheng Yi Yang; Yan Bing Hou; Xu Rong Xu

doi:10.1016/j.physb.2007.09.095

Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Lei Qian^*, Wei Liu, Bera Debasis, Feng Teng, Sheng Yi Yang, Yan Bing Hou, Xu Rong Xu

^*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

源语言	英语
页（从-至）	1719-1722
页数	4
期刊	Physica B: Condensed Matter
卷	403
期	10-11
DOI	https://doi.org/10.1016/j.physb.2007.09.095
出版状态	已出版 - 1 5月 2008
已对外发布	是

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10.1016/j.physb.2007.09.095

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Qian, L., Liu, W., Debasis, B., Teng, F., Yang, S. Y., Hou, Y. B., & Xu, X. R. (2008). Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure. Physica B: Condensed Matter, 403(10-11), 1719-1722. https://doi.org/10.1016/j.physb.2007.09.095

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title = "Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure",

abstract = "By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.",

keywords = "Disassociation, Franz-Keldysh model, MEH-PPV exciton",

author = "Lei Qian and Wei Liu and Bera Debasis and Feng Teng and Yang, {Sheng Yi} and Hou, {Yan Bing} and Xu, {Xu Rong}",

year = "2008",

month = may,

day = "1",

doi = "10.1016/j.physb.2007.09.095",

language = "English",

volume = "403",

pages = "1719--1722",

journal = "Physica B: Condensed Matter",

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T1 - Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

AU - Qian, Lei

AU - Liu, Wei

AU - Debasis, Bera

AU - Teng, Feng

AU - Yang, Sheng Yi

AU - Hou, Yan Bing

AU - Xu, Xu Rong

PY - 2008/5/1

Y1 - 2008/5/1

N2 - By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

AB - By using the Franz-Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

KW - Disassociation

KW - Franz-Keldysh model

KW - MEH-PPV exciton

UR - http://www.scopus.com/inward/record.url?scp=40949143664&partnerID=8YFLogxK

U2 - 10.1016/j.physb.2007.09.095

DO - 10.1016/j.physb.2007.09.095

M3 - Article

AN - SCOPUS:40949143664

SN - 0921-4526

VL - 403

SP - 1719

EP - 1722

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 10-11

ER -

Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

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