Abstract
At the beginning, it is presented that several theoretical and key technique problems among super-precision and nanometer measurement for circle and cylindrical contour, including: periodic reappearance of straight line datum movement; harmonic suppression in the measurement for circle contour; datum error's recognition and separation in the measurement for cylindrical contour; the problem of information integrality in the measurement for cylindrical contour. Then it is mainly introduced that the development research of super-precision measurement for circle and cylindrical contour, including: error separation technology with non-harmonic suppression; laser monitoring technology of straight line datum movement; error separation technology among datums, etc. Finally, give a vista of new promising measurement technique, such as the contour measurement based on the confocal microscopy, optical measuring techniques with non-datums and so on.
Original language | English |
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Pages (from-to) | 21-26 |
Number of pages | 6 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4222 |
DOIs | |
Publication status | Published - 2000 |
Externally published | Yes |
Event | Process Control and Inspection for Industry - Beijing, China Duration: 8 Nov 2000 → 10 Nov 2000 |