TY - JOUR
T1 - Development of research on super-precision measurement techniques for circle and cylindrical contour
AU - Tan, Jiubin
AU - Zhao, Weiqian
AU - Yang, Wenguo
PY - 2000
Y1 - 2000
N2 - At the beginning, it is presented that several theoretical and key technique problems among super-precision and nanometer measurement for circle and cylindrical contour, including: periodic reappearance of straight line datum movement; harmonic suppression in the measurement for circle contour; datum error's recognition and separation in the measurement for cylindrical contour; the problem of information integrality in the measurement for cylindrical contour. Then it is mainly introduced that the development research of super-precision measurement for circle and cylindrical contour, including: error separation technology with non-harmonic suppression; laser monitoring technology of straight line datum movement; error separation technology among datums, etc. Finally, give a vista of new promising measurement technique, such as the contour measurement based on the confocal microscopy, optical measuring techniques with non-datums and so on.
AB - At the beginning, it is presented that several theoretical and key technique problems among super-precision and nanometer measurement for circle and cylindrical contour, including: periodic reappearance of straight line datum movement; harmonic suppression in the measurement for circle contour; datum error's recognition and separation in the measurement for cylindrical contour; the problem of information integrality in the measurement for cylindrical contour. Then it is mainly introduced that the development research of super-precision measurement for circle and cylindrical contour, including: error separation technology with non-harmonic suppression; laser monitoring technology of straight line datum movement; error separation technology among datums, etc. Finally, give a vista of new promising measurement technique, such as the contour measurement based on the confocal microscopy, optical measuring techniques with non-datums and so on.
UR - http://www.scopus.com/inward/record.url?scp=0034461114&partnerID=8YFLogxK
U2 - 10.1117/12.403871
DO - 10.1117/12.403871
M3 - Conference article
AN - SCOPUS:0034461114
SN - 0277-786X
VL - 4222
SP - 21
EP - 26
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Process Control and Inspection for Industry
Y2 - 8 November 2000 through 10 November 2000
ER -