摘要
We studied the photoluminescence (PL) and structural properties of Ce and Yb co-doped silicon oxide films after high temperature annealing. The PL spectra of Ce3+ and Yb3+ ions were sensitive to the structural variation of the films, and the Yb PL intensities were significantly enhanced especially upon 1200 °C annealing. X-ray diffraction, transmission electron microscopy, and X-ray photoelectron spectroscopy, indicated that rare earth silicates and the CeO2 phase had formed in the oxides. The proportions of the phases varied with the "nominal Si-richness" of the films. Energy transfer from the excited Ce3+ to Yb3+ can be inferred from both PL excitation and decay spectra.
源语言 | 英语 |
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文章编号 | 043101 |
期刊 | Journal of Applied Physics |
卷 | 117 |
期 | 4 |
DOI | |
出版状态 | 已出版 - 28 1月 2015 |