Study on the feature matching of fingerprints

Xiao Bing Wu; Xue Shan Gao; Yun Ting Pang; Ke Jie Li

Study on the feature matching of fingerprints

Xiao Bing Wu^*, Xue Shan Gao, Yun Ting Pang, Ke Jie Li

^*此作品的通讯作者

机电学院

Beijing Institute of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

2 引用（Scopus）

摘要

Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

源语言	英语
页（从-至）	508-511
页数	4
期刊	Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
卷	26
期	6
出版状态	已出版 - 6月 2006

其它文件与链接

链接到 Scopus 的出版物

引用此

Wu, X. B., Gao, X. S., Pang, Y. T., & Li, K. J. (2006). Study on the feature matching of fingerprints. Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology, 26(6), 508-511.

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title = "Study on the feature matching of fingerprints",

abstract = "Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.",

keywords = "Feature match, Fingerprint, Local pattern",

author = "Wu, {Xiao Bing} and Gao, {Xue Shan} and Pang, {Yun Ting} and Li, {Ke Jie}",

year = "2006",

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AU - Wu, Xiao Bing

AU - Gao, Xue Shan

AU - Pang, Yun Ting

AU - Li, Ke Jie

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N2 - Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

AB - Some key problems on fingerprint minutiae matching are discussed. The quality of minutiae in the overlapping region and their matching are used to help in judging the comparability of two fingerprints. The local pattern method is used to get the optimal matching. Experiments show that these methods can accelerate the matching process and improve the matching precision.

KW - Feature match

KW - Fingerprint

KW - Local pattern

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M3 - Article

AN - SCOPUS:33748150005

SN - 1001-0645

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JO - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

JF - Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology

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Study on the feature matching of fingerprints

摘要

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