Reliable Simulation Analysis of Interface and SiON Degradation Effects on Water Vapor Barrier in Laminated Thin-Film Encapsulation

Xianwen Liu, Tao Sun, Xuyang Li, Bin Liu, Qi Yao, Shuo Zhang, Zongchi Bao, Feng Wang, Tao Wang, Rui Hong, Anyuan Qiu, Zhinong Yu^*

^*此作品的通讯作者