Reliable Simulation Analysis of Interface and SiON Degradation Effects on Water Vapor Barrier in Laminated Thin-Film Encapsulation

Xianwen Liu, Tao Sun, Xuyang Li, Bin Liu, Qi Yao, Shuo Zhang, Zongchi Bao, Feng Wang, Tao Wang, Rui Hong, Anyuan Qiu, Zhinong Yu*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Material Science