Reduced screening of remote phonon scattering in thin-film transistors caused by gate-electrode/gate-dielectric interlayer

Y. X. Ma, W. M. Tang*, P. T. Lai*

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

11 引用 （Scopus）

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Material Science