Plasmon-phonon resonance at gate-electrode/gate-dielectric interface on carrier mobility of organic TFTs with high-k gate dielectrics

Y. X. Ma, H. Su, W. M. Tang*, P. T. Lai

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

6 引用 （Scopus）

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Material Science