Observation of flat-band localization and topological edge states induced by effective strong interactions in electrical circuit networks

Xiaoqi Zhou, Weixuan Zhang*, Houjun Sun, Xiangdong Zhang*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

4 引用 (Scopus)

指纹

探究 'Observation of flat-band localization and topological edge states induced by effective strong interactions in electrical circuit networks' 的科研主题。它们共同构成独一无二的指纹。

Engineering

Material Science

Physics