Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma

Tao Cheng*, Wen Zhong Huang, Li Min Meng, Ying Jun Li, Jing Zhao, Jie Zhang

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.

源语言英语
页(从-至)2288-2291
页数4
期刊Guangzi Xuebao/Acta Photonica Sinica
37
11
出版状态已出版 - 11月 2008
已对外发布

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Cheng, T., Huang, W. Z., Meng, L. M., Li, Y. J., Zhao, J., & Zhang, J. (2008). Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma. Guangzi Xuebao/Acta Photonica Sinica, 37(11), 2288-2291.