Abstract
A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.
| Original language | English |
|---|---|
| Pages (from-to) | 2288-2291 |
| Number of pages | 4 |
| Journal | Guangzi Xuebao/Acta Photonica Sinica |
| Volume | 37 |
| Issue number | 11 |
| Publication status | Published - Nov 2008 |
| Externally published | Yes |
Keywords
- Absorption
- Multilayers
- Plasma
- Reflectivity
- X-ray laser
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Cheng, T., Huang, W. Z., Meng, L. M., Li, Y. J., Zhao, J., & Zhang, J. (2008). Novel way of measuring the multilayer reflectivity utilizing the symmetrical output of XRL in plasma. Guangzi Xuebao/Acta Photonica Sinica, 37(11), 2288-2291.