摘要
To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.
| 源语言 | 英语 |
|---|---|
| 主期刊名 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 |
| 出版商 | IEEE Computer Society |
| 页 | 2371-2374 |
| 页数 | 4 |
| ISBN（电子版） | 9781538609484 |
| DOI | |
| 出版状态 | 已出版 - 2 7月 2017 |
| 活动 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 - Singapore, 新加坡 期限: 10 12月 2017 → 13 12月 2017 |
出版系列
| 姓名 | IEEE International Conference on Industrial Engineering and Engineering Management |
|---|---|
| 卷 | 2017-December |
| ISSN（印刷版） | 2157-3611 |
| ISSN（电子版） | 2157-362X |
会议
| 会议 | 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 |
|---|---|
| 国家/地区 | 新加坡 |
| 市 | Singapore |
| 时期 | 10/12/17 → 13/12/17 |
指纹
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Li, S. (2017). Nonparametric variance control charts based on siegel-tukey test. 在 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 (页码 2371-2374). (IEEE International Conference on Industrial Engineering and Engineering Management; 卷 2017-December). IEEE Computer Society. https://doi.org/10.1109/IEEM.2017.8290316