Nonparametric variance control charts based on siegel-tukey test

Suyi Li

doi:10.1109/IEEM.2017.8290316

Nonparametric variance control charts based on siegel-tukey test

Suyi Li^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.

Original language	English
Title of host publication	2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017
Publisher	IEEE Computer Society
Pages	2371-2374
Number of pages	4
ISBN (Electronic)	9781538609484
DOIs	https://doi.org/10.1109/IEEM.2017.8290316
Publication status	Published - 2 Jul 2017
Event	2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 - Singapore, Singapore Duration: 10 Dec 2017 → 13 Dec 2017

Publication series

Name	IEEE International Conference on Industrial Engineering and Engineering Management
Volume	2017-December
ISSN (Print)	2157-3611
ISSN (Electronic)	2157-362X

Conference

Conference	2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017
Country/Territory	Singapore
City	Singapore
Period	10/12/17 → 13/12/17

Keywords

Distribution-free
Phase II chart
Quality Control
Rank-Sum test
Simulation

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10.1109/IEEM.2017.8290316

Cite this

Li, S. (2017). Nonparametric variance control charts based on siegel-tukey test. In 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 (pp. 2371-2374). (IEEE International Conference on Industrial Engineering and Engineering Management; Vol. 2017-December). IEEE Computer Society. https://doi.org/10.1109/IEEM.2017.8290316

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title = "Nonparametric variance control charts based on siegel-tukey test",

abstract = "To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.",

keywords = "Distribution-free, Phase II chart, Quality Control, Rank-Sum test, Simulation",

author = "Suyi Li",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 ; Conference date: 10-12-2017 Through 13-12-2017",

year = "2017",

month = jul,

day = "2",

doi = "10.1109/IEEM.2017.8290316",

language = "English",

series = "IEEE International Conference on Industrial Engineering and Engineering Management",

publisher = "IEEE Computer Society",

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}

Li, S 2017, Nonparametric variance control charts based on siegel-tukey test. in 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017. IEEE International Conference on Industrial Engineering and Engineering Management, vol. 2017-December, IEEE Computer Society, pp. 2371-2374, 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017, Singapore, Singapore, 10/12/17. https://doi.org/10.1109/IEEM.2017.8290316

Nonparametric variance control charts based on siegel-tukey test. / Li, Suyi.
2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017. IEEE Computer Society, 2017. p. 2371-2374 (IEEE International Conference on Industrial Engineering and Engineering Management; Vol. 2017-December).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.

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Nonparametric variance control charts based on siegel-tukey test

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Keywords

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