Layer dependence of the electronic band alignment of few-layer Mo S2 on Si O2 measured using photoemission electron microscopy

Morgann Berg*, Kunttal Keyshar, Ismail Bilgin, Fangze Liu, Hisato Yamaguchi, Robert Vajtai, Calvin Chan, Gautam Gupta, Swastik Kar, Pulickel Ajayan, Taisuke Ohta, Aditya D. Mohite

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

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Physics

Material Science