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Layer dependence of the electronic band alignment of few-layer Mo S2 on Si O2 measured using photoemission electron microscopy
Morgann Berg*, Kunttal Keyshar, Ismail Bilgin, Fangze Liu, Hisato Yamaguchi, Robert Vajtai, Calvin Chan, Gautam Gupta, Swastik Kar, Pulickel Ajayan, Taisuke Ohta, Aditya D. Mohite
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
38
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(Scopus)