摘要
We present a complete description of "topological darkness" in a threedimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
源语言 | 英语 |
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主期刊名 | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings |
出版商 | Institute of Electrical and Electronics Engineers Inc. |
页 | 1-2 |
页数 | 2 |
ISBN(电子版) | 9781943580279 |
DOI | |
出版状态 | 已出版 - 25 10月 2017 |
已对外发布 | 是 |
活动 | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - San Jose, 美国 期限: 14 5月 2017 → 19 5月 2017 |
出版系列
姓名 | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings |
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卷 | 2017-January |
会议
会议 | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 |
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国家/地区 | 美国 |
市 | San Jose |
时期 | 14/05/17 → 19/05/17 |
指纹
探究 'Dispersion topological darkness' 的科研主题。它们共同构成独一无二的指纹。引用此
Song, H., Zhang, N., Duan, J., Liu, Z., Gao, J., Singer, M. H., Ji, D., Cheney, A. R., Zeng, X., Chen, B., Jiang, S., & Gan, Q. (2017). Dispersion topological darkness. 在 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings (页码 1-2). (2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings; 卷 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/CLEO_AT.2017.FM2G.7