Abstract
We present a complete description of "topological darkness" in a threedimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
Original language | English |
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Title of host publication | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-2 |
Number of pages | 2 |
ISBN (Electronic) | 9781943580279 |
DOIs | |
Publication status | Published - 25 Oct 2017 |
Externally published | Yes |
Event | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - San Jose, United States Duration: 14 May 2017 → 19 May 2017 |
Publication series
Name | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings |
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Volume | 2017-January |
Conference
Conference | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 |
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Country/Territory | United States |
City | San Jose |
Period | 14/05/17 → 19/05/17 |
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Song, H., Zhang, N., Duan, J., Liu, Z., Gao, J., Singer, M. H., Ji, D., Cheney, A. R., Zeng, X., Chen, B., Jiang, S., & Gan, Q. (2017). Dispersion topological darkness. In 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings (pp. 1-2). (2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/CLEO_AT.2017.FM2G.7