TY - GEN
T1 - Application of adaptive optics in complicated and integrated spatial multisensor system and its measurement analysis
AU - Ding, Quanxin
AU - Guo, Chunjie
AU - Cai, Meng
AU - Liu, Hua
PY - 2007
Y1 - 2007
N2 - Adaptive Optics Expand System is a kind of new concept spatial equipment, which concerns system, cybernetics and informatics deeply, and is key way to improve advanced sensors ability. Traditional Zernike Phase Contrast Method is developed, and Accelerated High-level Phase Contrast Theory is established. Integration theory and mathematical simulation is achieved. Such Equipment, which is based on some crucial components, such as, core optical system, multi mode wavefront sensor and so on, is established for AOES advantageous configuration and global design. Studies on Complicated Spatial Multisensor System Integratation and measurement Analysis including error analysis are carried out.
AB - Adaptive Optics Expand System is a kind of new concept spatial equipment, which concerns system, cybernetics and informatics deeply, and is key way to improve advanced sensors ability. Traditional Zernike Phase Contrast Method is developed, and Accelerated High-level Phase Contrast Theory is established. Integration theory and mathematical simulation is achieved. Such Equipment, which is based on some crucial components, such as, core optical system, multi mode wavefront sensor and so on, is established for AOES advantageous configuration and global design. Studies on Complicated Spatial Multisensor System Integratation and measurement Analysis including error analysis are carried out.
UR - http://www.scopus.com/inward/record.url?scp=39049102138&partnerID=8YFLogxK
U2 - 10.1117/12.783117
DO - 10.1117/12.783117
M3 - Conference contribution
AN - SCOPUS:39049102138
SN - 9780819468802
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
T2 - 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Y2 - 8 July 2007 through 12 July 2007
ER -