A 144-fJ/Bit Reliable and Compact TRNG Based on the Diffusive Resistance of 3-D Resistive Random Access Memory

Xiaoran Li*, Yiming Wang, Yiming Yang, Shidong Lv, Qing Luo, Xinghua Wang*, Xiaoxin Xu*, Dengyun Lei*, Feng Zhang*

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用 （Scopus）

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