A 144-fJ/Bit Reliable and Compact TRNG Based on the Diffusive Resistance of 3-D Resistive Random Access Memory

Xiaoran Li*, Yiming Wang, Yiming Yang, Shidong Lv, Qing Luo, Xinghua Wang*, Xiaoxin Xu*, Dengyun Lei*, Feng Zhang*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

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