0.1~325 GHz频段InP DHBT器件在片测试结构建模

Engineering

• Capacitive 50%
• Equivalent Circuit Model 50%
• Measured Result 50%
• Model Topology 100%
• Resistive 50%
• Simulated Result 50%
• Skin Effect 50%
• Test Structure 100%

Material Science

• Electronic Circuit 100%