0.1~325 GHz频段InP DHBT器件在片测试结构建模

Translated title of the contribution: On-wafer test structures modeling for the InP DHBTs in the frequency range of 0.1~325 GHz

Zhong Chao Xu, Jun Liu*, Feng Qian, Hai Yan Lu, Wei Cheng, Wen Yong Zhou

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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