Wavefront fitting and evaluation of fiber point diffraction interferometer

Shuo Wu*, Ding Guo Sha, Jia Ming Lin, Tao Geng Zhou, Ling Feng Chen, Liang Nie

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents Zernike polynomials fitting wave front which is detected by fiber point diffraction interferometer (FPDI). To confirm that Zernike polynomials are suitable for fitting concave spherical mirror surface, different orders of Zernike polynomials were used to fit several different surfaces which are produced by computer. Fitting result errors were evaluated by residual standard deviation. It is illuminated that Zernike polynomials are suitable for fitting surface which changes smoothly but not suitable for fitting surface with sharp fluctuating. When the shape changes dramatically Zernike polynomials are unable to correctly fit. Choosing appropriate term of polynomials, more terms don't mean higher precision. A metal coated concave spherical mirror, curvature radius 580mm, caliber 70mm, was measured as a sample. The five-step phase shifting interferograms of good quality were detected by an experimental FPDI which was built in lab. Measured wave front was fitted by 36 terms of Zernike polynomials from phase map which were unwrapped from five-step phase shifting interferograms. The measurement result was obtained and compared with that by Zygo interferometer when measured the same mirror. The 2 represented wave fronts have same characters such as centers bulging and marginal trough.

Original languageEnglish
Title of host publication3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptical Test and Measurement Technology and Equipment
DOIs
Publication statusPublished - 2007
Event3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China
Duration: 8 Jul 200712 Jul 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6723
ISSN (Print)0277-786X

Conference

Conference3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Country/TerritoryChina
CityChengdu
Period8/07/0712/07/07

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