Gender: Male
Title: Associate Professor
Education: Doctoral student
Discipline: Instrument Science and Technology
Research interests: Photoelectric precision measurement technology, photoelectric imaging system performance evaluation, measurement uncertainty
E-mail: djkclf@bit.edu.cn Office phone: 68912576-25
Chen Lingfeng, male, was born in May 1974 in Danjiangkou City, Hubei Province. He graduated from the Department of Optoelectronic Engineering, Beijing Institute of Technology, majoring in Test Metrology Technology and Instrumentation in 2004. In 2010, he was appointed as an associate researcher, and in 2017, he was appointed as a doctoral supervisor and director of the modern photoelectric Instrument Laboratory. He has been engaged in teaching and scientific research in the field of photoelectric precision measurement for a long time, and his main research interests include optical fiber point diffraction phase-shifting interferometry, digital imaging system performance evaluation, measurement uncertainty, etc. He has presided over 8 provincial and ministerial projects, including National Natural Science Foundation project, major instrument special sub-project, Doctoral Foundation of the Ministry of Education, GF Technology Basic Research, 863 Innovation Fund, etc. He has published more than 20 academic papers in international and domestic journals such as Optics Express, Applied Optics, Optics Communications, Journal of Instrumentation, and Journal of Metrology. A total of 14 national invention patents were applied for, and 8 national invention patents were obtained as the first inventor. The research results won 1 first prize of GF technology invention, 2 second prizes, and 1 third prize of GF Technology Progress Award. Participated in the compilation of the textbook "Optical Testing Technology". He taught the course "Digital Imaging System Performance Evaluation" for graduate students and "Digital Camera Performance Evaluation" for undergraduate students. There are 14 graduate students, 2 doctoral students and 2 master students. Member of Optical Testing Committee of Chinese Optical Society. Applied Optics, Optics & Laser Technology, IEEE Transactions on Instrument & measurement and other international journal reviewers. China National Accreditation Service for Conformity Assessment (CNAS) laboratory accreditation Director reviewer. Laboratory accreditation reviewer.

Chen Lingfeng, male, was born in May 1974 in Danjiangkou City, Hubei Province. He graduated from the Department of Optoelectronic Engineering, Beijing Institute of Technology, majoring in Test Metrology Technology and Instrumentation in 2004. In 2010, he was appointed as an associate researcher, and in 2017, he was appointed as a doctoral supervisor and director of the modern photoelectric Instrument Laboratory. He has been engaged in teaching and scientific research in the field of photoelectric precision measurement for a long time, and his main research interests include optical fiber point diffraction phase-shifting interferometry, digital imaging system performance evaluation, measurement uncertainty, etc. He has presided over 8 provincial and ministerial projects, including National Natural Science Foundation project, major instrument special sub-project, Doctoral Foundation of the Ministry of Education, GF Technology Basic Research, 863 Innovation Fund, etc. He has published more than 20 academic papers in international and domestic journals such as Optics Express, Applied Optics, Optics Communications, Journal of Instrumentation, and Journal of Metrology. A total of 14 national invention patents were applied for, and 8 national invention patents were obtained as the first inventor. The research results won 1 first prize of GF technology invention, 2 second prizes, and 1 third prize of GF Technology Progress Award. Participated in the compilation of the textbook "Optical Testing Technology". He taught the course "Digital Imaging System Performance Evaluation" for graduate students and "Digital Camera Performance Evaluation" for undergraduate students. There are 14 graduate students, 2 doctoral students and 2 master students. Member of Optical Testing Committee of Chinese Optical Society. Applied Optics, Optics & Laser Technology, IEEE Transactions on Instrument & measurement and other international journal reviewers. China National Accreditation Service for Conformity Assessment (CNAS) laboratory accreditation Director reviewer. Laboratory accreditation reviewer.

1. Photoelectric precision test technology;
2. Photoelectric imaging system performance evaluation;
3. Measurement uncertainty.

1991.9-1995.7, Bachelor of Engineering, Department of Mechanical Engineering, Hubei University of Technology;
1998.9-2001.3, Master of Engineering, Department of Mechanical Engineering, Hubei University of Technology;
2001.3-2004.3, Doctor of Engineering, Department of Optoelectronic Engineering, Beijing Institute of Technology.

2004.4-present Beijing Institute of Technology, teacher.
2011.2-2012.3 National Institute of Standards and Technology (NIST), Visiting Scholar.

【论文】
1. Lingfeng Chen*, Xiaojien Meng, He Xiao, Lei Yu, and Yufei Xue，Experimental ray-tracing with point diffraction interferometry and its application in focal length measurement，Applied Optics，Vol.57,No. 29, pp.8648-8653 (2018)；
2. Lingfeng Chen*; Jinjian Hao; Zhipu Chen; Xiaofei Guo, "Focal length measurement by fiber point diffraction longitudinal interferometry," Optics Communications, Vol.322, pp48-53(2014)；
3. Lingfeng Chen*, Xiaofei Guo, and Jinjian Hao, "Lens refractive index measurement based on fiber point-diffraction longitudinal interferometry," Optics Express, Vol. 21, No. 19, pp.22389-22399(2013)；
4. Lingfeng Chen*, Xiaofei Guo, and Jinjian Hao, "Refractive index measurement by fiber point diffraction longitudinal shearing interferometry," Applied Optics, Vol. 52, No. 16, pp. 3655–3661 (2013)；
5. Jungjae Park*, Lingfeng Chen, Quandou Wang, and Ulf Griesmann,"Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers", Optics Express, Vol. 20, No. 18, pp.20078-20089(2012).
6. Lingfeng Chen*, XushengZhang, JiamingLin, DingguoSha，Signal-to-noise ratio evaluation of a CCD camera，Optics and Laser Technology，Vol.41，No. 5, pp.574-579(2009)；
7. Chen Lingfeng*, Ren Yaqing, Li Jie，Flat surface measurement on fiber point diffraction interferometer，Optical Engineering，Vol.49，No. 5 , pp.050503-1~3(2010)；
8.陈凌峰*，抽样引起的测量不确定度评定，计量学报，Vol.41，No.7，891-896(2020)；
9.陈凌峰*，深入讨论标准不确定度A类评定中的极差法，计量学报，Vol.40，No.2，347-352(2019)；
【教材】
光学测试技术（第二版，编写第六章），沙定国主编，北京理工大学出版社，2010。
【获奖】
1.高精度XXX测量技术及应用，2019年12月，GF技术发明一等奖（第5），中华人民共和国工业和信息化部
2.XXX参数测试与校准技术，2013年12月，GF技术发明二等奖（第6），中华人民共和国工业和信息化部
3.XXX测试技术与装置，2008年12月，GF技术发明二等奖（第6），中华人民共和国工业和信息化部
【国家发明专利】
1.陈凌峰*; 郭晓菲; 郝金剑等，基于双光纤点衍射移相干涉的折射率测量技术与装置, ZL201210552991.5.
2.陈凌峰*; 李杰; 周桃庚等，大相对孔径球面面形的光纤点衍射移相干涉测量方法, ZL201010151219.3.
3.陈凌峰*; 任雅青; 吴朔等，一种光学平面面形的光纤点衍射移相干涉测量方法, ZL200910237426.8.
4.陈凌峰*; 李杰; 周桃庚等，光纤点衍射移相干涉仪的平面面形测量方法, ZL201010194545.2.
5.陈凌峰*; 任雅青; 吴朔等，一种光学球面面形的光纤点衍射移相干涉测量方法, ZL200910235650.3.
6.陈凌峰*; 任雅青; 李杰等，一种光学平面面形的绝对干涉测量方法, ZL201010001177.5.
7.陈凌峰*；张旭升；周桃庚等，一种CCD摄像机信噪比数字化测试方法，ZL200710119819.X