Type-II Interface Band Alignment in the vdW PbI2-MoSe2Heterostructure

Junting Xiao, Lei Zhang, Hui Zhou, Ziyi Shao, Jinxin Liu, Yuan Zhao, Youzhen Li, Xiaoliang Liu, Haipeng Xie, Yongli Gao, Jia Tao Sun, Andrew T.S. Wee, Han Huang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

Energy band alignments at heterostructure interfaces play key roles in device performance, especially between two-dimensional atomically thin materials. Herein, van der Waals PbI2-MoSe2 heterostructures fabricated by in situ PbI2 deposition on monolayer MoSe2 are comprehensively studied using scanning tunneling microscopy/spectroscopy, atomic force microscopy, photoemission spectroscopy, and Raman and photoluminescence (PL) spectroscopy. PbI2 grows on MoSe2 in a quasi layer-by-layer epitaxial mode. A type-II interface band alignment is proposed between PbI2 and MoSe2 with the conduction band minimum (valence band maximum) located at PbI2 (MoSe2), which is confirmed by first-principles calculations and the existence of interfacial excitons revealed using temperature-dependent PL. Our findings provide a scalable method to fabricate PbI2-MoSe2 heterostructures and new insights into the electronic structures for future device design.

Original languageEnglish
Pages (from-to)32099-32105
Number of pages7
JournalACS applied materials & interfaces
Volume12
Issue number28
DOIs
Publication statusPublished - 15 Jul 2020

Keywords

  • MoSe
  • PbI
  • Raman and PL spectroscopy
  • type II band alignment
  • vdW heterostructure

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