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The frequency dependence of microstructure evolution in a ferroelectric nano-film during AC dynamic polarization switching
Yu Su
, George J. Weng
*
*
Corresponding author for this work
School of Aerospace Engineering
Rutgers - The State University of New Jersey, New Brunswick
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peer-review
8
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Material Science
Film
100%
Thin Films
100%
Ferroelectric Material
100%
Barium Titanate
33%
Energy Density
16%
Phase Field Model
16%
Domain Wall
16%