Stress accumulation in Ni-rich layered oxide cathodes: Origin, impact, and resolution

Yuefeng Su, Qiyu Zhang, Lai Chen*, Liying Bao, Yun Lu, Shi Chen, Feng Wu

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

100 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Stress accumulation in Ni-rich layered oxide cathodes: Origin, impact, and resolution'. Together they form a unique fingerprint.

Material Science