Scaling relationship among indentation properties of electromagnetic materials at micro- and nanoscale

Hao Zhou; Honglong Zhang; Yongmao Pei; Hao Sen Chen; Hongwei Zhao; Daining Fang

doi:10.1063/1.4913716

Scaling relationship among indentation properties of electromagnetic materials at micro- and nanoscale

Hao Zhou, Honglong Zhang, Yongmao Pei^*, Hao Sen Chen, Hongwei Zhao, Daining Fang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

Electromagnetic materials have been widely employed in micro-functional devices. Using multi-field nanoindentation technique, we have investigated the local deformation behavior of various electromagnetic materials in the form of bulk materials, foils, and thin films under electric or magnetic field. Based on dimensional analysis and experimental data, a field tunable scaling relationship among hardness, reduced contact elastic modulus, and indentation work has been found. Furthermore, a method to determine the hardness and reduced modulus of electromagnetic materials is proposed, which avoids the error from estimating the indentation contact area. This work is meaningful for the characterization of mechanical properties and design of devices made of electromagnetic materials.

Original language	English
Article number	081904
Journal	Applied Physics Letters
Volume	106
Issue number	8
DOIs	https://doi.org/10.1063/1.4913716
Publication status	Published - 23 Feb 2015
Externally published	Yes

Access to Document

10.1063/1.4913716

Cite this

@article{df7971548fc4406285607624793bbcab,

title = "Scaling relationship among indentation properties of electromagnetic materials at micro- and nanoscale",

abstract = "Electromagnetic materials have been widely employed in micro-functional devices. Using multi-field nanoindentation technique, we have investigated the local deformation behavior of various electromagnetic materials in the form of bulk materials, foils, and thin films under electric or magnetic field. Based on dimensional analysis and experimental data, a field tunable scaling relationship among hardness, reduced contact elastic modulus, and indentation work has been found. Furthermore, a method to determine the hardness and reduced modulus of electromagnetic materials is proposed, which avoids the error from estimating the indentation contact area. This work is meaningful for the characterization of mechanical properties and design of devices made of electromagnetic materials.",

author = "Hao Zhou and Honglong Zhang and Yongmao Pei and Chen, {Hao Sen} and Hongwei Zhao and Daining Fang",

note = "Publisher Copyright: {\textcopyright} 2015 AIP Publishing LLC.",

year = "2015",

month = feb,

day = "23",

doi = "10.1063/1.4913716",

language = "English",

volume = "106",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - Scaling relationship among indentation properties of electromagnetic materials at micro- and nanoscale

AU - Zhou, Hao

AU - Zhang, Honglong

AU - Pei, Yongmao

AU - Chen, Hao Sen

AU - Zhao, Hongwei

AU - Fang, Daining

PY - 2015/2/23

Y1 - 2015/2/23

N2 - Electromagnetic materials have been widely employed in micro-functional devices. Using multi-field nanoindentation technique, we have investigated the local deformation behavior of various electromagnetic materials in the form of bulk materials, foils, and thin films under electric or magnetic field. Based on dimensional analysis and experimental data, a field tunable scaling relationship among hardness, reduced contact elastic modulus, and indentation work has been found. Furthermore, a method to determine the hardness and reduced modulus of electromagnetic materials is proposed, which avoids the error from estimating the indentation contact area. This work is meaningful for the characterization of mechanical properties and design of devices made of electromagnetic materials.

AB - Electromagnetic materials have been widely employed in micro-functional devices. Using multi-field nanoindentation technique, we have investigated the local deformation behavior of various electromagnetic materials in the form of bulk materials, foils, and thin films under electric or magnetic field. Based on dimensional analysis and experimental data, a field tunable scaling relationship among hardness, reduced contact elastic modulus, and indentation work has been found. Furthermore, a method to determine the hardness and reduced modulus of electromagnetic materials is proposed, which avoids the error from estimating the indentation contact area. This work is meaningful for the characterization of mechanical properties and design of devices made of electromagnetic materials.

UR - http://www.scopus.com/inward/record.url?scp=84923869771&partnerID=8YFLogxK

U2 - 10.1063/1.4913716

DO - 10.1063/1.4913716

M3 - Article

AN - SCOPUS:84923869771

SN - 0003-6951

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

M1 - 081904

ER -

Scaling relationship among indentation properties of electromagnetic materials at micro- and nanoscale

Abstract

Access to Document

Other files and links

Fingerprint

Cite this