Abstract
By considering the interaction between charge carriers recombination and transport through the bulk at high fields, the expression of recombination efficiency for single-layer diodes is presented. By parameters calculation, a maximum recombination efficiency is promised for device ITO/ MEH-PPV(120 nm)/Ca, and the same experimental fact for ITO/BEH-PPV(100 nm)/Ca [Y. Kawabe, et al., J. Appl. Phys. 84, 5306 (1998)] proved our theoretical prediction.
Original language | English |
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Pages (from-to) | 2529-2531 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 79 |
Issue number | 16 |
DOIs | |
Publication status | Published - 15 Oct 2001 |
Externally published | Yes |