Planar alignment sensor based on Rayleigh interference in two wavelengths

Yao Hu*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Precise alignment of planar optical element is common in industry or scientific research. In this paper, a planar alignment sensor based on Rayleigh interference in two wavelengths is proposed. Monochromatic probing lasers in two wavelengths point normally to the two mirror-reflection planes, and the reflective beams carrying alignment information are focused by a lens to form Rayleigh interference patterns at the focal plane. Four-quadrant detectors pick up the patterns and output angular and coplanar adjustment signals according to the rotational-symmetry and axial-symmetry of the pattern. Preliminary experiment demonstrated the feasibility of the method.

Original languageEnglish
Title of host publicationOptical Design and Testing V
DOIs
Publication statusPublished - 2012
EventOptical Design and Testing V - Beijing, China
Duration: 5 Nov 20127 Nov 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8557
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Design and Testing V
Country/TerritoryChina
CityBeijing
Period5/11/127/11/12

Keywords

  • Alignment sensor
  • Coplanar mirrors
  • Parallelism of planes
  • Rayleigh interference

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