Fingerprint
Dive into the research topics of 'Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers
Jungjae Park*, Lingfeng Chen, Quandou Wang, Ulf Griesmann
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
30
Citations
(Scopus)