Microstructure variations induced by excess PbX2 or AX within perovskite thin films

Guanhaojie Zheng; Cheng Zhu; Yihua Chen; Juchen Zhang; Qi Chen; Xingyu Gao; Huanping Zhou

doi:10.1039/c7cc07534k

Microstructure variations induced by excess PbX₂ or AX within perovskite thin films

Guanhaojie Zheng, Cheng Zhu, Yihua Chen, Juchen Zhang, Qi Chen, Xingyu Gao^*, Huanping Zhou

^*Corresponding author for this work

Advanced Research Institute of Multidisciplinary Science

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

We systematically investigated the impact of stoichiometric ratio variation between PbX₂ and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

Original language	English
Pages (from-to)	12966-12969
Number of pages	4
Journal	Chemical Communications
Volume	53
Issue number	96
DOIs	https://doi.org/10.1039/c7cc07534k
Publication status	Published - 2017

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Zheng, G., Zhu, C., Chen, Y., Zhang, J., Chen, Q., Gao, X., & Zhou, H. (2017). Microstructure variations induced by excess PbX₂ or AX within perovskite thin films. Chemical Communications, 53(96), 12966-12969. https://doi.org/10.1039/c7cc07534k

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AU - Zheng, Guanhaojie

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AU - Zhang, Juchen

AU - Chen, Qi

AU - Gao, Xingyu

AU - Zhou, Huanping

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Microstructure variations induced by excess PbX₂ or AX within perovskite thin films

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