Investigation of Structural, Chemical, and Electrical Properties of CdTe/Back Contact Interface by TEM and XPS

Jun feng Han*, V. Krishnakumar, H. J. Schimper, Li mei Cha, Cheng Liao

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Investigation of Structural, Chemical, and Electrical Properties of CdTe/Back Contact Interface by TEM and XPS'. Together they form a unique fingerprint.

Material Science