Internal damage evolution investigation of C/SiC composites using in-situ tensile X-ray computed tomography testing and digital volume correlation at 1000 °C

Guohao Niu, Rongqi Zhu, Hongshuai Lei, Rubing Zhang, Panding Wang*, Zhaoliang Qu, Daining Fang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)

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