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In-situ quantitative tracking of micro-crack evolution behavior inside CMCs under load at high temperature: A deep learning method
Rongqi Zhu, Guohao Niu, Zhaoliang Qu*, Panding Wang, Rubing Zhang, Daining Fang
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
13
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(Scopus)