High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites

W. G. Mao*, J. Chen, M. S. Si, R. F. Zhang, Q. S. Ma, D. N. Fang, X. Chen

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

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