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HfO2 dielectric thickness dependence of electrical properties in graphene field effect transistors with double conductance minima
Cheng Zhang, Dan Xie*, Jian Long Xu, Xin Ming Li, Yi Lin Sun, Rui Xuan Dai, Xian Li, Hong Wei Zhu
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
12
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(Scopus)